Mixed-signal circuits and data converters Image sensors are being used more than ever in different applications: smartphones, automotive, film, surveillance, product quality control, etc. Regardless of the application, the trend of increasing resolution is consistent and can still be observed. Advancements in CMOS photosensitive devices and 3D chip technology give rise to new image sensor configurations that alleviate the challenges of increasing resolution. One such configuration is having an ADC per pixel. This research aims to develop an imager system with pixel-parallel conversion in small-pitched pixels.
For the future of this research, it is also intended to add more digital functionalities in-pixel aside from just measuring the intensity of the impinging light. This is in line with the drive to integrate intelligence into the detector. Some functionalities investigated are pixel binning, filtering, change detection, and feature extraction.
