PetaOps/W edge-AI μProcessors: Myth or reality?Manil Dev Gomony, Floran de Putter, Anteneh Gebregiorgis, Gianna Paulin, Linyan Mei, Vikram Jain, Said Hamdioui, Victor Sanchez, Tobias Grosser, Marc Geilen, Marian Verhelst, Friedemann Zenke, Frank Gurkaynak, Barry de Bruin, Sander Stuijk, Simon Davidson, Sayandip De, Mounir Ghogho, Alexandra Jimborean, Sherif Eissa, Luca Benini, Dimitrios Soudris, Rajendra Bishnoi, Sam Ainsworth, Federico Corradi, Ouassim Karrakchou, Tim Gueneysu, and Henk Corporaal · Conference Proceeding · 20232023 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATE; 2023; pp.
A Compact 0.98 THz Source With On-Chip Antenna In 250-nm InP DHBTSenne Gielen, Yang Zhang, Mark Ingels, and Patrick Reynaert · Conference Proceeding · 20232023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS); 2023; pp. 86 - 89
Energy-Quality Scalable Design Space Exploration of Approximate FFT Hardware ArchitecturesPedro Taua Lopes Pereira, Patricia Ucker Leleu da Costa, Guilherme da Costa Ferreira, Brunno Alves de Abreu, Guilherme Paim, Eduardo Antonio Cesar da Costa, and Sergio Bampi · Journal Article · 2022IEEE Transactions On Circuits And Systems I-Regular Papers; 2022; Vol. 69; iss. 11; pp. 4524 - 4534
A cryogenic inertial sensor for terrestrial and lunar gravitational-wave detectionJoris van Heijningen, Alberto Gatti, Elvis Camilo Ferreira, Florian Bocchese, Stéphane Lucas, Andrea Perali, and Filip Tavernier · Journal Article · 2022Nuclear Instruments & Methods In Physics Research Section A-Accelerators Spectrometers Detectors And Associated Equipment; 2022; Vol. 1041; pp.
Photoplethysmography (PPG) Sensor Circuit Design Techniquesqiuyang Lin, Wim Sijbers, Christina Avidikou, Chris Van Hoof, Filip Tavernier, and Nick Van Helleputte · Conference Proceeding · 20222022 IEEE Custom Integrated Circuits Conference (CICC); 2022; pp.
DIANA: An End-to-End Energy-Efficient Digital and ANAlog Hybrid Neural Network SoCKodai Ueyoshi, Ioannis A Papistas, Pouya Houshmand, Giuseppe Maria Sarda, Vikram Jain, man Shi, Qilin Zheng, Sebastian Giraldo, Peter Vranckx, Jonas Doevenspeck, Debjyoti Bhattacharjee, Stefan Cosemans, Arindam Mallik, Peter Debacker, Diederik Verkest, and Marian Verhelst · Conference Proceeding · 20222022 IEEE International Conference on Solid-State Circuits (ISSCC); 2022; Vol. 65; pp.
Recent Trends and Perspectives on Defect-Oriented TestingP Bernardi, R Cantoro, A Coyette, W Dobbeleare, M Fieback, A Floridia, G Gielen, J Gomez, M Grosso, AM Guerriero, I Guglielminetti, S Hamdioui, G Insinga, N Mautone, N Mirabella, S Sartoni, M Sonza Reorda, R Ullmann, R Vanhooren, N Xama, and L Wu · Conference Proceeding · 20222022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022); 2022; pp.