Roughness analysis for EUV lithographyA Vaglio Pret, Pavel Poliakov, D Bianche, R Gronheid, P Blomme, Miranda Corbalan, J Van Houdt, and Wim Dehaene · Conference Proceeding · 2010
Efficient simulation model for DAC dynamic propertiesPieter De Wit and Georges Gielen · Conference Proceeding · 2010Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS) ; 2010; pp. 2896 - 2899
Compact Model for Organic Thin-Film TransistorLing Li, Hagen Marien, Jan Genoe, Michel Steyaert, and Paul Heremans · Journal Article · 2010IEEE Electron Device Letters ; 2010; Vol. 31; iss. 3; pp. 210 - 212
Circuit Design for Bias Compatibility in Novel FinFET based floating RAMPavel Poliakov, A Anchlia, M Garia Bardon, Bram Rooseleer, B De Wachter, N Collaert, K van der Zanden, Wim Dehaene, D Verkest, and Miranda Corbalan · Journal Article · 2010IEEE Transactions on Circuits and Systems II, Express Briefs ; 2010; Vol. 57; iss. 3; pp. 183 - 187
All-digital differential VCO-based A/D conversionJorg Daniels, Wim Dehaene, and Michel Steyaert · Conference Proceeding · 2010Proceedings of 2010 IEEE International Symposium on Circuits and Sytems (ISCAS) ; 2010; pp. 1085 - 1088
An RDL-configurable 3D memory tier to replace on-chip SRAMMarco Facchini, Pol Marchal, Francky Catthoor, and Wim Dehaene · Conference Proceeding · 2010Proceedings of the Design, Automation and Test in Europe Conference - DATE ; 2010; pp. 291 - 294
Test structures for characterization of through silicon viasMichele Stucchi, Dan Perry, Guruprasad Katti, and Wim Dehaene · Conference Proceeding · 2010Proceedings of the 23rd IEEE International Conference on Microelectronic Test Structures - ICMTS ; 2010; pp. 130 - 134
Verifying electrical/thermal/thermo-mechanical behavior of a 3D stack-challenges and solutionsGeert Van der Plas, Steven Thijs, Dimitri Linten, Katti Guruprasad, Paresh Limaye, Abdelkarim Mercha, Michele Stucchi, Herman Oprins, Bart Vandevelde, Nikolas Minas, Miro Cupac, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Eric Beyne, and Paul Marchal · Conference Proceeding · 2010IEEE Custom Integrated Circuits Conference; 2010; pp.
Temperature dependent electrical characteristics of through-si-via (TSV) interconnectionsGuruprasad Katti, Abdelkarim Mercha, Michele Stucchi, Zsolt Tokei, Dimitrios Velenis, Jan Van Olmen, Cedric Huyghebaert, Anne Jourdain, Michal Rakowski, Ingrid Debusschere, Philippe Soussan, Herman Oprins, Wim Dehaene, Kristin De Meyer, Youssef Travaly, Eric Beyne, Serge Biesemans, and Bart Swinnen · Conference Proceeding · 2010Proceedings of the IEEE International Interconnect Technology Conference - IITC; 2010
Organic RFID tagsKris Myny, Soeren Steudel, Peter Vicca, Monique J Beenhakkers, Nick AJM van Aerle, Gerwin H Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Book Chapter · 2010Radio Frequency Identification Fundamentals and Applications Design Methods and Solutions ; 2010; pp. 311 - 324
Robust digital design in organic electronics by dual-gate technologyKris Myny, Monique J Beenhakkers, Nick AJM van Aerle, Gerwin H Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Conference Proceeding · 2010Proceedings of the IEEE International Solid-State Circuits Conference - ISSCC ; 2010; Vol. 53; pp. 140 - 141
Towards EPC compatible plastic RFID tagsKris Myny, Soeren Steudel, Peter Vicca, Steve Smout, MJ Beenhakkers, NAJM Van Aerle, F Furthner, B Van der Putten, AK Tripathi, Gerwin Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Conference Proceeding · 2010Proceedings of the 218th ECS Meeting : E13 - Thin Film Transistors 10 (TFT 10) ; 2010; Vol. 33; iss. 5; pp. 1830 - ...
EMI Resisting Analog Input CircuitsJean-Michel Redoute and Michiel Steyaert · Book Chapter · 2010EMC OF ANALOG INTEGRATED CIRCUITS; 2010; pp. 141 - 195
EMI Resisting Analog Output CircuitsJean-Michel Redoute and Michiel Steyaert · Book Chapter · 2010EMC OF ANALOG INTEGRATED CIRCUITS; 2010; pp. 83 - 139
RFID, Where are they?W Dehaene, G Gielen, M Steyaert, H Danneels, V Desmedt, C De Roover, Z Li, M Verhelst, N Van Helleputte, S Radiom, C Walravens, and L Pleysier · Conference Proceeding · 2009ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference; 2009; pp. 56 - 63
Plastic circuits and tags for 13.56 MHz radio-frequency communicationKris Myny, Soeren Steudel, Peter Vicca, Monique Beenhakkers, Nick van Aerle, Gerwin Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Journal Article · 2009Solid-State Electronics; 2009; Vol. 53; iss. 12; pp. 1220 - 1226
Modelling of gamma-Radiation Effects in Bipolar Transistors with VHDL-AMSWouter De Cock, Hans Versmissen, Paul Leroux, Marco Van Uffelen, and Michel Steyaert · Conference Proceeding · 2009Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS; 2009; pp. 61 - 64