Bidirectional Communication in an HF Hybrid Organic/Solution-Processed Metal-Oxide RFID TagKris Myny, Maarten Rockelé, Adrian Nelson Vaisman Chasin, D-V Pham, J Steiger, S Botnaras, D Weber, B Herold, J Ficker, B Van der Putten, G Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Conference Proceeding · 20122012 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC) ; 2012; Vol. 55; pp. 312 - 313
Hervormingen in het secundair onderwijsBart Pattyn, Hilde Colpin, Mieke De Cock, Bieke De Fraine, Wim Dehaene, Steven Groenez, Bregt Henkens, Ides Nicaise, Jan Masschelein, Erwin Ooghe, Bart Raymaekers, Maarten Simons, Jan Van Damme, and Karine Verschueren · Text Resource · 2012Metaforum visietekst 7 ; 2012; pp. 1 - 48
Leakage current mechanisms and estimation in memories and logicAshoka Sathanur, Praveen Raghavan, Stefan Cosemans, and Wim Dehaene · Book Chapter · 2012Energy-Aware Memory Management for Embedded Multimedia Systems: A Computer-Aided Design Approach ; 2012; pp. 239 - 256
Design Methodologies for Organic RFID Tags and Sensor Readout on FoilKris Myny, Hagen Marien, Soeren Steudel, Peter Vicca, MJ Beenhakkers, NAJM van Aerle, GH Gelinck, Jan Genoe, Wim Dehaene, Michiel Steyaert, Paul Heremans, and Eugenio Cantatore · Book Chapter · 2012Organic Electronics II: More Materials and Applications ; 2012; pp. 387 - 411
Linking EUV lithography line edge roughness and 16 nm NAND memory performanceAlessandro Vaglio Pret, Pavel Poliakov, Roel Gronheid, Pieter Blomme, Miguel Miranda Corbalan, Wim Dehaene, Diederik Verkest, Jan Van Houdt, and Davide Bianchi · Journal Article · 2012Microelectronic Engineering ; 2012; Vol. 98; iss. 10; pp. 24 - 28
Spacer-defined EUV lithography reducing variability of 12nm NAND Flash memoriesPavel Poliakov, Pieter Blomme, Alessandro Vaglio Pret, Miguel Miranda Corbalan, Roel Gronheid, Vincent Wiaux, Janko Versluijs, Diederik Verkest, Jan Van Houdt, and Wim Dehaene · Conference Proceeding · 20124th IEEE International Memory Workshop - IMW ; 2012; pp. 33 - 36
Leakage control in SoCsPraveen Raghavan, Ashoka Sathanur, Stefan Cosemans, and Wim Dehaene · Book Chapter · 2012Energy-Aware Memory Management for Embedded Multimedia Systems: A Computer-Aided Design Approach ; 2012; pp. 257 - 280
Test structures for characterization of through-silicon viasMichele Stucchi, Daniel Perry, Guruprasad Katti, Wim Dehaene, and Dimitrios Velenis · Journal Article · 2012IEEE Transactions on Semiconductor Manufacturing; 2012; Vol. 25; iss. 3; pp. 355 - 364
An 8b organic microprocessor on plastic foilKris Myny, Erik van Veenendaal, Gerwin H Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Conference Proceeding · 2011Proc. IEEE International Solid-State Circuits Conference (ISSCC 2011) ; 2011; pp. 322 - 324
Towards EPC-Compatible Organic RFID TagsKris Myny, Soeren Steudel, Peter Vicca, Steve Smout, Monique J Beenhakkers, Nick AJM van Aerle, Francois Furthner, Bas van der Putten, Ashutosh K Tripathi, Gerwin H Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Conference Proceeding · 2011ANALOG CIRCUIT DESIGN: ROBUST DESIGN, SIGMA DELTA CONVERTERS, RFID ; 2011; pp. 347 - 367
Si-based tunnel field-effect transistors for low-power nano-electronicsAnne Verhulst, William Vandenberghe, Daniele Leonelli, Rita Rooyackers, Anne Vandooren, Jing Zhuge, Frank Kao, Bart Soree, Wim Magnus, Massimo Fischetti, Geoffrey Pourtois, Cedric Huyghebaert, Ru Huang, Yangyuan Wang, Kristin De Meyer, Wim Dehaene, Marc Heyns, and Guido Groeseneken · Conference Proceeding · 2011Device Research Conference - Conference Digest, DRC; 2011; pp. 193 - 196
Design issues and considerations for low-cost 3-D TSV IC technologyGeert Van der Plas, Paresh Limaye, Igor Loi, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Antonio Pullini, Federico Angiolini, Luca Benini, Wim Dehaene, Youssef Travaly, Eric Beyne, and Paul Marchal · Journal Article · 2011IEEE Journal of Solid-State Circuits ; 2011; Vol. 46; iss. 1; pp. 293 - 307
Tunnel field-effect transistors for low-power nano-electronicsAnne Verhulst, William Vandenberghe, Daniele Leonelli, Frank Kao, Rita Rooyackers, Anne Vandooren, Jing Zhuge, Bart Soree, Wim Magnus, Massimo Fischetti, Geoffrey Pourtois, Ru Huang, Yangyuan Wang, Kristin De Meyer, Wim Dehaene, Cedric Huyghebaert, Marc Heyns, and Guido Groeseneken · Conference Proceeding · 2011
Roughness analysis for EUV lithographyA Vaglio Pret, Pavel Poliakov, D Bianche, R Gronheid, P Blomme, Miranda Corbalan, J Van Houdt, and Wim Dehaene · Conference Proceeding · 2010
Circuit Design for Bias Compatibility in Novel FinFET based floating RAMPavel Poliakov, A Anchlia, M Garia Bardon, Bram Rooseleer, B De Wachter, N Collaert, K van der Zanden, Wim Dehaene, D Verkest, and Miranda Corbalan · Journal Article · 2010IEEE Transactions on Circuits and Systems II, Express Briefs ; 2010; Vol. 57; iss. 3; pp. 183 - 187
All-digital differential VCO-based A/D conversionJorg Daniels, Wim Dehaene, and Michel Steyaert · Conference Proceeding · 2010Proceedings of 2010 IEEE International Symposium on Circuits and Sytems (ISCAS) ; 2010; pp. 1085 - 1088
An RDL-configurable 3D memory tier to replace on-chip SRAMMarco Facchini, Pol Marchal, Francky Catthoor, and Wim Dehaene · Conference Proceeding · 2010Proceedings of the Design, Automation and Test in Europe Conference - DATE ; 2010; pp. 291 - 294
Test structures for characterization of through silicon viasMichele Stucchi, Dan Perry, Guruprasad Katti, and Wim Dehaene · Conference Proceeding · 2010Proceedings of the 23rd IEEE International Conference on Microelectronic Test Structures - ICMTS ; 2010; pp. 130 - 134
Verifying electrical/thermal/thermo-mechanical behavior of a 3D stack-challenges and solutionsGeert Van der Plas, Steven Thijs, Dimitri Linten, Katti Guruprasad, Paresh Limaye, Abdelkarim Mercha, Michele Stucchi, Herman Oprins, Bart Vandevelde, Nikolas Minas, Miro Cupac, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Eric Beyne, and Paul Marchal · Conference Proceeding · 2010IEEE Custom Integrated Circuits Conference; 2010; pp.
Temperature dependent electrical characteristics of through-si-via (TSV) interconnectionsGuruprasad Katti, Abdelkarim Mercha, Michele Stucchi, Zsolt Tokei, Dimitrios Velenis, Jan Van Olmen, Cedric Huyghebaert, Anne Jourdain, Michal Rakowski, Ingrid Debusschere, Philippe Soussan, Herman Oprins, Wim Dehaene, Kristin De Meyer, Youssef Travaly, Eric Beyne, Serge Biesemans, and Bart Swinnen · Conference Proceeding · 2010Proceedings of the IEEE International Interconnect Technology Conference - IITC; 2010
Organic RFID tagsKris Myny, Soeren Steudel, Peter Vicca, Monique J Beenhakkers, Nick AJM van Aerle, Gerwin H Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Book Chapter · 2010Radio Frequency Identification Fundamentals and Applications Design Methods and Solutions ; 2010; pp. 311 - 324
Robust digital design in organic electronics by dual-gate technologyKris Myny, Monique J Beenhakkers, Nick AJM van Aerle, Gerwin H Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Conference Proceeding · 2010Proceedings of the IEEE International Solid-State Circuits Conference - ISSCC ; 2010; Vol. 53; pp. 140 - 141
Towards EPC compatible plastic RFID tagsKris Myny, Soeren Steudel, Peter Vicca, Steve Smout, MJ Beenhakkers, NAJM Van Aerle, F Furthner, B Van der Putten, AK Tripathi, Gerwin Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Conference Proceeding · 2010Proceedings of the 218th ECS Meeting : E13 - Thin Film Transistors 10 (TFT 10) ; 2010; Vol. 33; iss. 5; pp. 1830 - ...
Plastic circuits and tags for 13.56 MHz radio-frequency communicationKris Myny, Soeren Steudel, Peter Vicca, Monique Beenhakkers, Nick van Aerle, Gerwin Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Journal Article · 2009Solid-State Electronics; 2009; Vol. 53; iss. 12; pp. 1220 - 1226
Circuit Design for Bias Compatibility Investigation of Bulk FinFET Based Floating Body RAMAnkur Anchlia, Marie Garcia Bardon, Pavel Poliakov, Bram Rooseleer, Bart De Wachter, Nadine Collaert, K van der Zanden, Miguel Miranda Corbalan, Wim Dehaene, and Diederik Verkest · Conference Proceeding · 2009Proceedings of the 2009 IEEE International Workshop on Memory Technology, Design and Testing ; 2009; pp. 7 - 12
RFID, WHere are they ?Wim Dehaene, Georges Gielen, Michel Steyaert, Hans Danneels, Valentijn De Smedt, Christophe De Roover, Zheng Li, Marian Verhelst, Nick Van Helleputte, Soheil Radiom, Cedric Walravens, and L Pleysier · Conference Proceeding · 2009Proceedings of ESSCIRC 2009; 2009; pp. 37 - 44