A low power embedded SRAM for wireless applicationsStefan Cosemans, Wim Dehaene, and Francky Catthoor · Conference Proceeding · 2006ESSCIRC 2006: PROCEEDINGS OF THE 32ND EUROPEAN SOLID-STATE CIRCUITS CONFERENCE; 2006; pp. 291 - +
Evolution of substrate noise generation mechanisms with CMOS technology scalingMustafa Badaroglu, Piet Wambacq, Geert Van der Plas, Stephane Donnay, Georges Gielen, and Hugo De Man · Journal Article · 2006IEEE Transactions on Circuits and Systems I, Fundamental Theory and Applications ; 2006; Vol. 53; iss. 2; pp. 296 - 305
An EMI resisting LIN driverJean-Michel Redouté and Michel Steyaert · Conference Proceeding · 200632nd European Solid-State Circuits Conference (ESSCIRC) ; 2006; pp. 580 - 583
An injection-locked upconversion mixerWim Laflere and Michel Steyaert · Conference Proceeding · 2006The European Microwave Association ; 2006; pp. 167 - 172
Analog interface circuitsMichel Steyaert, Willem Laflere, and Wim Vereecken · Book Chapter · 2006Philips Research Book Series : Amlware - Hardware Techology drivers of ambient intelligence ; 2006; pp. 203 - 222
ESD-RF co-design methodology for the state of the art RF-CMOS blocksVesselin Vassilev, Steven Thijs, Pablo Segura, Piet Wambacq, Paul Leroux, Natarajan Mahadeva Iyer, Herman Maes, and Michel Steyaert · Journal Article · 2005Microelectronics Reliability ; 2005; Vol. 45; iss. 2; pp. 255 - 268
A yield-aware modeling methodology for nano-scaled SRAM designsEvelyn Grossar, Jeroen Croon, Michele Stucchi, Wim Dehaene, and Karen Maex · Conference Proceeding · 20052005 INTERNATIONAL CONFERENCE ON INTEGRATED CIRCUIT DESIGN AND TECHNOLOGY; 2005; pp. 33 - 36
Systematic top-down design of A/D convertersMartin Vogels and Georges Gielen · Conference Proceeding · 2005European Conference on Circuit Theory and Design; 2005; Vol. 1; pp. 293 - 296
Mismatch characterization of chip interconnect resistanceJurgen Deveugele, Libin Yao, Michel Steyaert, and Willy Sansen · Conference Proceeding · 2005IEEE International Conference on Microelectronic Test Structures ; 2005; pp. 183 - 186