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Publications
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Development of an Open-Source Smart Energy House for K-12 EducationFrederik Geth, Jan Verveckken, Niels Leemput, Juan Van Roy, Jef Beerten, Pieter Tielens, Valentijn De Smedt, Sandro Iacovella, Borbála Hunyadi, Ninah Koolen, Hans De Clercq, Georges Gielen, Bob Puers, Sabine Van Huffel, Ronnie Belmans, Geert Deconinck, Wim Dehaene, and Johan Driesen · Conference Proceeding · 2013Proc. IEEE Power and Energy Society Annual Meeting ; 2013; pp. 1 - 5
Developing Engineering-oriented Educational Workshops Within a Student BranchJan Verveckken, Frederik Geth, Borbála Hunyadi, Jef Beerten, Niels Leemput, Juan Van Roy, Pieter Tielens, Valentijn De Smedt, Sandro Iacovella, Ninah Koolen, Hans De Clercq, Johan Driesen, Georges Gielen, Bob Puers, Joos Vandewalle, Sabine Van Huffel, Ronnie Belmans, Geert Deconinck, and Wim Dehaene · Conference Proceeding · 2013Proc. IEEE EUROCON 2013 ; 2013; pp. 933 - 939
Organic RFID tagsKris Myny, Soeren Steudel, Peter Vicca, Steve Smout, Monique J Beenhakkers, Nick AJM van Aerle, François Furthner, Bas van der Putten, Ashutosh K Tripathi, Gerwin H Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Book Chapter · 2013Applications of Organic and Printed Electronics - A Technology-Enabled Revolution ; 2013; pp. 133 - 155
An Ultra-Low-Power, Batteryless Microsystem for Wireless Sensor NetworksHans Danneels, Valentijn De Smedt, Christophe De Roover, Soheil Radiom, Nick Van Helleputte, Cedric Walravens, Zheng Li, Michiel Steyaert, Marian Verhelst, Wim Dehaene, and Georges Gielen · Conference Proceeding · 2012Procedia Engineering ; 2012; Vol. 47; pp. 1406 - 1409
F5: Bioelectronics for sustainable healthcareC Van Hoof, W Dehaene, W Liu, T Denison, M Je, and HJ Yoo · Conference Proceeding · 2012Digest of Technical Papers - IEEE International Solid-State Circuits Conference; 2012; Vol. 55; pp. 506 - 507
Bidirectional Communication in an HF Hybrid Organic/Solution-Processed Metal-Oxide RFID TagKris Myny, Maarten Rockelé, Adrian Nelson Vaisman Chasin, D-V Pham, J Steiger, S Botnaras, D Weber, B Herold, J Ficker, B Van der Putten, G Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Conference Proceeding · 20122012 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC) ; 2012; Vol. 55; pp. 312 - 313
Hervormingen in het secundair onderwijsBart Pattyn, Hilde Colpin, Mieke De Cock, Bieke De Fraine, Wim Dehaene, Steven Groenez, Bregt Henkens, Ides Nicaise, Jan Masschelein, Erwin Ooghe, Bart Raymaekers, Maarten Simons, Jan Van Damme, and Karine Verschueren · Text Resource · 2012Metaforum visietekst 7 ; 2012; pp. 1 - 48
Leakage current mechanisms and estimation in memories and logicAshoka Sathanur, Praveen Raghavan, Stefan Cosemans, and Wim Dehaene · Book Chapter · 2012Energy-Aware Memory Management for Embedded Multimedia Systems: A Computer-Aided Design Approach ; 2012; pp. 239 - 256
Design Methodologies for Organic RFID Tags and Sensor Readout on FoilKris Myny, Hagen Marien, Soeren Steudel, Peter Vicca, MJ Beenhakkers, NAJM van Aerle, GH Gelinck, Jan Genoe, Wim Dehaene, Michiel Steyaert, Paul Heremans, and Eugenio Cantatore · Book Chapter · 2012Organic Electronics II: More Materials and Applications ; 2012; pp. 387 - 411
Linking EUV lithography line edge roughness and 16 nm NAND memory performanceAlessandro Vaglio Pret, Pavel Poliakov, Roel Gronheid, Pieter Blomme, Miguel Miranda Corbalan, Wim Dehaene, Diederik Verkest, Jan Van Houdt, and Davide Bianchi · Journal Article · 2012Microelectronic Engineering ; 2012; Vol. 98; iss. 10; pp. 24 - 28
Spacer-defined EUV lithography reducing variability of 12nm NAND Flash memoriesPavel Poliakov, Pieter Blomme, Alessandro Vaglio Pret, Miguel Miranda Corbalan, Roel Gronheid, Vincent Wiaux, Janko Versluijs, Diederik Verkest, Jan Van Houdt, and Wim Dehaene · Conference Proceeding · 20124th IEEE International Memory Workshop - IMW ; 2012; pp. 33 - 36
Leakage control in SoCsPraveen Raghavan, Ashoka Sathanur, Stefan Cosemans, and Wim Dehaene · Book Chapter · 2012Energy-Aware Memory Management for Embedded Multimedia Systems: A Computer-Aided Design Approach ; 2012; pp. 257 - 280
Test structures for characterization of through-silicon viasMichele Stucchi, Daniel Perry, Guruprasad Katti, Wim Dehaene, and Dimitrios Velenis · Journal Article · 2012IEEE Transactions on Semiconductor Manufacturing; 2012; Vol. 25; iss. 3; pp. 355 - 364
3D stacked IC demonstration using a through silicon via first approachJ Van Olmen, A Mercha, G Katti, C Huyghebaert, J Van Aelst, E Seppala, Z Chao, S Armini, J Vaes, R Teixeira Cotrin, M Van Cauwenberghe, P Verdonck, K Verhemeldonck, A Jourdain, W Ruythooren, M De Potter De Ten Broeck, A Opdebeeck, T Chiarella, B Parvais, I Debusschere, TY Hoffmann, M Stucchi, M Rakowski, P Soussan, R Cartuyvels, E Beyne, S Biesemans, B Swinnen, and W Dehaene · Conference Proceeding · 2011IMAPS International Conference and Exhibition on Device Packaging - In Conjunction with the Global Business Council, GBC 2011 Spring Conference; 2011; pp. 76 - 79
An 8b organic microprocessor on plastic foilKris Myny, Erik van Veenendaal, Gerwin H Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Conference Proceeding · 2011Proc. IEEE International Solid-State Circuits Conference (ISSCC 2011) ; 2011; pp. 322 - 324
Towards EPC-Compatible Organic RFID TagsKris Myny, Soeren Steudel, Peter Vicca, Steve Smout, Monique J Beenhakkers, Nick AJM van Aerle, Francois Furthner, Bas van der Putten, Ashutosh K Tripathi, Gerwin H Gelinck, Jan Genoe, Wim Dehaene, and Paul Heremans · Conference Proceeding · 2011ANALOG CIRCUIT DESIGN: ROBUST DESIGN, SIGMA DELTA CONVERTERS, RFID ; 2011; pp. 347 - 367
Si-based tunnel field-effect transistors for low-power nano-electronicsAnne Verhulst, William Vandenberghe, Daniele Leonelli, Rita Rooyackers, Anne Vandooren, Jing Zhuge, Frank Kao, Bart Soree, Wim Magnus, Massimo Fischetti, Geoffrey Pourtois, Cedric Huyghebaert, Ru Huang, Yangyuan Wang, Kristin De Meyer, Wim Dehaene, Marc Heyns, and Guido Groeseneken · Conference Proceeding · 2011Device Research Conference - Conference Digest, DRC; 2011; pp. 193 - 196
Design issues and considerations for low-cost 3-D TSV IC technologyGeert Van der Plas, Paresh Limaye, Igor Loi, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Antonio Pullini, Federico Angiolini, Luca Benini, Wim Dehaene, Youssef Travaly, Eric Beyne, and Paul Marchal · Journal Article · 2011IEEE Journal of Solid-State Circuits ; 2011; Vol. 46; iss. 1; pp. 293 - 307
Tunnel field-effect transistors for low-power nano-electronicsAnne Verhulst, William Vandenberghe, Daniele Leonelli, Frank Kao, Rita Rooyackers, Anne Vandooren, Jing Zhuge, Bart Soree, Wim Magnus, Massimo Fischetti, Geoffrey Pourtois, Ru Huang, Yangyuan Wang, Kristin De Meyer, Wim Dehaene, Cedric Huyghebaert, Marc Heyns, and Guido Groeseneken · Conference Proceeding · 2011
Roughness analysis for EUV lithographyA Vaglio Pret, Pavel Poliakov, D Bianche, R Gronheid, P Blomme, Miranda Corbalan, J Van Houdt, and Wim Dehaene · Conference Proceeding · 2010