STEM Education in Flanders: How STEM@school aims to foster STEM literacy and a positive attitude towards STEMHeidi Knipprath, Lieve Thibaut, Marie-Paule Buyse, Stijn Ceuppens, Haydee De Loof, Jolien De Meester, Leen Goovaerts, Annemie Struyf, Jelle Boeve-De Pauw, Fien Depaepe, Johan Deprez, Mieke De Cock, Luc Hellinckx, Greet Langie, Katrien Struyven, Didier Van de Velde, Peter Van Petegem, and Wim Dehaene · Journal Article · 2018IEEE Instrumentation & Measurement Magazine; 2018; Vol. 21; iss. 3; pp. 36 - 40
Printed Organic Photodetector Arrays and their use in Palmprint ScannersHylke Akkerman, Bart Peeters, Albert Van Breemen, Santhosh Shanmugam, Daniel Tordera, Jan-Laurens van der Steen, Auke Jisk Kronemeijer, Pawel E Malinowski, Florian De Roose, David Cheyns, Jan Genoe, Wim Dehaene, Paul Heremans, and Gerwin Gelinck · Conference Proceeding · 2018Society for Information Display International Symposium Digest of Technical Papers; 2018; pp. 494 - 497
Evaluatiekeuze en –praktijken bij iSTEMLeen Goovaerts, Katrien Struyven, Mieke De Cock, and Wim Dehaene · Conference Proceeding · 2018Evaluatiekeuze en –praktijken bij iSTEM ; 2018; pp. 12 - 12
Integrated STEM education: A systematic review of instructional practices in secondary educationLieve Thibaut, Stijn Ceuppens, Haydée De Loof, Jolien De Meester, Leen Goovaerts, Annemie Struyf, Jelle Boeve-De Pauw, Wim Dehaene, Johan Deprez, Mieke De Cock, Luc Hellinckx, Heidi Knipprath, Greet Langie, Katrien Struyven, Didier Van de Velde, Peter Van Petegem, and Fien Depaepe · Journal Article · 2018European Journal of STEM Education; 2018; Vol. 3; iss. 1; pp. 1 - 12
Leren ontwerpen van STEM-integrerend leermateriaalJolien De Meester, Heidi Knipprath, Marie-Paule Buyse, Stijn Ceuppens, Haydée De Loof, Leen Goovaerts, Luc Hellinckx, Annemie Struyf, Lieve Thibaut, Didier Van de Velde, Jelle Boeve-de Pauw, Mieke De Cock, Fien Depaepe, Johan Deprez, Greet Langie, Katrien Struyven, Peter Van Petegem, and Wim Dehaene · Journal Article · 2017Tijdschrift voor Lerarenopleiders ; 2017; Vol. 38; iss. 4; pp. 27 - 36
EMI resisting low-EME SENT drivers in 0.18μm CMOSB Baran, H Pues, K Stijnen, and W Dehaene · Conference Proceeding · 2017Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017; 2017; pp. 69 - 72
Geïntegreerd STEM-onderwijs in de praktijkHeidi Knipprath, Jolien De Meester, Mieke De Cock, Jelle Boeve-de-Pauw, Stijn Ceuppens, Wim Dehaene, Haydee De Loof, Fien Depaepe, Leen Goovaerts, Luc Hellinckx, Annemie Struyf, Lieve Thibaut, Didier van de Velde, and Peter van Petegem · Other · 2017
SRAM enablement beyond N7: a BTI studyMohit Kumar Gupta, Pieter Weckx, Stefan Cosemans, Pieter Schuddinck, Rogier Baert, Doyoung Jang, Yasser Sherazi, Praveen Raghavan, Ben Kaczer, Alessio Spessot, Anda Mocuta, and Wim Dehaene · Conference Proceeding · 2017IEEE International Reliability Physics Sysmposium - IRPS ; 2017; pp. 4 - ...
Multidisciplinary Learning through Implementation of the DVB-S2 StandardYuri Murillo Mange, Bertold Van den Bergh, Jona Beysens, Alexander Bertrand, Wim Dehaene, Panos Patrinos, Tinne Tuytelaars, Ruth Sabariego, Marian Verhelst, Patrick Wambacq, and Sofie Pollin · Journal Article · 2017IEEE Communications Magazine; 2017; Vol. 55; iss. 5; pp. 124 - 130
Power saving through state retention in IGZO-TFT AMOLED displays for wearable applicationsSoeren Steudel, Jan-Laurens PJ van der Steen, Manoj Nag, Tung Huei Ke, Steve Smout, Thijs Bel, Karin van Diesen, Gerard de Haas, Joris Maas, Joris de Riet, Madelon Rovers, Roy Verbeek, Yen-Yu Huang, Shin-Chuan Chiang, Marc Ameys, Florian De Roose, Wim Dehaene, Jan Genoe, Paul Heremans, Gerwin Gelinck, and Auke Jisk Kronemeijer · Journal Article · 2017Journal of the Society for Information Display ; 2017; Vol. 25; iss. 4; pp. 222 - 228
Integrated STEM makes a difference!Heidi Knipprath, Jolien De Meester, Jelle Boeve-de-Pauw, Stijn Ceuppens, Mieke De Cock, Wim Dehaene, Haydee De Loof, Fien Depaepe, Leen Goovaerts, Luc Hellinckx, Annemie Struyf, Lieve Thibaut, Didier Van de Velde, and Peter Van Petegem · Other · 2017
Mitigation of sense amplifier degradation using input switchingDaniel Kraak, Innocent Agbo, Motta Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, and Wim Dehaene · Conference Proceeding · 201720th ACM/IEEE Design and Test in Europe Conference - DATE ; 2017; pp. 858 - 863
Sense amplifier offset voltage mitigation under presence of BTIDaniel Kraak, Innocent Agbo, Motta Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, and Wim Dehaene · Conference Proceeding · 2017Workshop on Reliability, Security and Quality - RESCUE; 2017
Power saving through state retention in IGZO-TFT AMOLED displays for wearable applicationsSoeren Steudel, Jan-Laurens van der Steen, Manoj Nag, Tung Huei Ke, Steve Smout, Thijs BEL, Karin Van Diesen, Gerard de Haas, Joris Maas, Joris de Riet, Madelon Rovers, Roy Verbeek, Yen-Yu Huang, Shin-Chuan Chiang, Marc Ameys, Florian De Roose, Wim Dehaene, Jan Genoe, Paul Heremans, Gerwin Gelinck, and Auke Kronemeijer · Conference Proceeding · 2017SID - Display Week ; 2017; pp. 37 - 41
An 8-11 Bit 320kS/S Resolution Scalable Noise Shaping SAR ADCThomas Bos, Komail Badami, Wim Dehaene, and Marian Verhelst · Conference Proceeding · 20172017 15th IEEE International New Circuits and Systems Conference ; 2017; Vol. 15; pp. 209 - 212
Benchmarking of monolithic 3D integrated MX2 FETs with Si FinFETsTarun Agarwal Kumar, Aron Szabo, Marie Garcia Bardon, Bart Soree, Iuliana Radu, Praveen Raghavan, Mathieu Luisier, Wim Dehaene, and Marc Heyns · Conference Proceeding · 20172017 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM); 2017; pp. 131 - 134
An active artificial iris controlled by a 25-µW flexible driverFlorian De Roose, Soeren Steudel, Kris Myny, Myriam Willegems, Steve Smout, Marc Ameys, Pawel E Malinowski, Robert Gehlhaar, Radhika Poduval, Xinyu Chen, Jelle De Smet, Andrés Vásquez Quintero, Herbert De Smet, Wim Dehaene, and Jan Genoe · Conference Proceeding · 2016International Electron Device Meeting (IEDM) 2016 ; 2016; pp. 32 - ...
Impact of DSA process variability on circuit performanceIoannis Karageorgos, Jan Doise, Paulina Rincon Delgadillo, Michele Stucchi, Rogier Baert, Roel Gronheid, Julien Ryckaert, Geert Vandenberghe, and Wim Dehaene · Conference Proceeding · 2016Proc. DSA2016; 2016
Impact of DSA process variability on circuit performanceIoannis Karageorgos, Jan Doise, Paulina Rincon Delgadillo, Michele Stucchi, Rogier Baert, Roel Gronheid, Julien Ryckaert, Geert Vandenberghe, and Wim Dehaene · Other · 2016Proc. DSA Symposium 2016; 2016; pp.
An OFDM based local positioning systemRobin Theunis, Tuba Ayhan, Nico De Clercq, Paramartha Indirayanti, Tom Redant, Risang Gatot Yudanto, Johan Cockx, Frederik Petre, Patrick Reynaert, Marian Verhelst, Paul Leroux, and Wim Dehaene · Conference Proceeding · 2016Indoor positioning and indoor navigation 2016 ; 2016; pp. 1 - 4