Door de website toch te gebruiken met deze browser kan de website er anders uitzien dan bedoelt en kunnen wij de veiligheid niet garanderen
Publications
Search the MICAS publications database.
0 resultaten
Recent Trends and Perspectives on Defect-Oriented TestingP Bernardi, R Cantoro, A Coyette, W Dobbeleare, M Fieback, A Floridia, G Gielen, J Gomez, M Grosso, AM Guerriero, I Guglielminetti, S Hamdioui, G Insinga, N Mautone, N Mirabella, S Sartoni, M Sonza Reorda, R Ullmann, R Vanhooren, N Xama, and L Wu · Conference Proceeding · 20222022 IEEE 28TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2022); 2022; pp.
Circuit models for the co-simulation of superconducting quantum computing systemsRohith Acharya, Fahd A Mohiyaddin, Anton Potocnik, Kristiaan De Greve, Bogdan Govoreanu, Iuliana P Radu, Georges Gielen, and Francky Catthoor · Conference Proceeding · 2021PROCEEDINGS OF THE 2021 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2021); 2021; pp. 968 - 973
A 5Gb/s 7.1fJ/b/mm 8× Multi-Drop On-Chip 10mm Data Link in 14nm FinFET CMOS SOI at 0.5VElisa Sacco, Pier Andrea Francese, Matthias Brändli, Christian Menolfi, Thomas Morf, Alessandro Cevrero, Ilter Ozkaya, Marcel Kossel, Lukas Kull, Danny Luu, Hazar Yueksel, Georges Gielen, and Thomas Toifl · Conference Proceeding · 20172017 SYMPOSIUM ON VLSI CIRCUITS; 2017; pp. C54 - C55
Drift mitigation in integrated sensor interfacesGeorges Gielen, Jorge Marin, and Elisa Sacco · Conference Proceeding · 20172017 7TH IEEE INTERNATIONAL WORKSHOP ON ADVANCES IN SENSORS AND INTERFACES (IWASI); 2017; pp. 51 - 51
An integrated multi-electrode-optrode array for in vitro optogeneticsMarleen Welkenhuysen, Luis Hoffman, Zhengxiang Luo, Anabel De Proft, Chris Van Den Haute, Veerle Baekelandt, Zeger Debyser, Georges Gielen, Bob Puers, and Dries Braeken · Journal Article · 2016Scientific Reports ; 2016; Vol. 6; iss. 1; pp. 20353 - ...
Time-Based Sensor Interface Circuits in CMOS and Carbon Nanotube TechnologiesGeorges Gielen, Jelle Van Rethy, Jorge Marin Niño De Zepeda, Max M Shulaker, Gage Hills, H-S Philip Wong, and Subhasish Mitra · Journal Article · 2016IEEE Transactions on Circuits and Systems 1, Regular Papers; 2016; Vol. 63; iss. 5; pp. 577 - 586
Comparative experimental analysis of time-dependent variability using a transistor test arrayMarko Simicic, Alexandre Subirats, Pieter Weckx, Ben Kaczer, Jacopo Franco, Philippe Roussel, Dimitri Linten, Aaron Thean, Guido Groeseneken, and Georges Gielen · Conference Proceeding · 2016IEEE International Reliability Physics Symposium - IRPS ; 2016; Vol. 2016-September; pp.