What
In this seminar, I will present my research on test methods to detect hard and soft defects in integrated circuits. I will first explain how production tests are usually done, categorized as functional and parametric tests. Then I will describe the difference between hard defects, which cause immediate failures, and soft defects. Further, we will discuss soft defects such as pinholes that remain latent during production and fail later in the field. Next, I will describe how adding extra test transistors as a DFT feature can help detect these latent defects, such as pinholes.
When
13/2/2026 11:00 - 12:00
Where
ESAT Aula L
